VU Boekhandel

Diffuse X-Ray Scattering and Models of Disorder

Hoofdkenmerken

Auteur:	Welberry, Thomas Richard
Titel:	Diffuse X-Ray Scattering and Models of Disorder
Uitgever:	Oxford University Press
ISBN:	9780199583812
Serie:	International Union of
Land van oorsprong:	United Kingdom
Prijs:	€ 81.19
Verschijningsdatum:	14-01-2010
Bericht:	Langere levertijd (2-3 weken)

Inhoudelijke kenmerken

Leesniveau:	Postgraduate, Research & Scholarly
Categorie:	3D graphics & modelling
Geillustreerd:	180 line drawings and photographs

Technische kenmerken

Verschijningsvorm:	Paperback / softback
Paginas:	280
Hoogte mm.:	159
Breedte mm.:	234
Dikte mm.:	14
Gewicht gr.:	480

Inhoud:

Diffuse X-ray scattering is a rich source of local structural information over and above that obtained by conventional crystallography. The book aims to show how computer simulation of a model crystal provides a general method by which diffuse scattering of all kinds and from all types of materials can be interpreted and analysed.