VU Boekhandel

Hoofdkenmerken

Auteur:	Tu, King-Ning
Titel:	Elements of Electromigration Electromigration in 3D IC technology
Uitgever:	Taylor & Francis Ltd
ISBN:	9781032470283
Land van oorsprong:	United Kingdom
Prijs:	€ 78.96
Verschijningsdatum:	25-12-2025
Bericht:	Langere levertijd (2-3 weken)

Inhoudelijke kenmerken

Categorie:	Electronic devices & materials
Geillustreerd:	5 Tables, black and white; 27 Line drawings, black and white; 38 Halftones, black and white; 65 Illustrations, black and white

Technische kenmerken

Verschijningsvorm:	Paperback / softback
Paginas:	132
Hoogte mm.:	246
Breedte mm.:	174
Gewicht gr.:	260

Inhoud:

In this invaluable resource for graduate students and practicing professionals, Tu and Liu provide a comprehensive account of electromigration and give a practical guide on how to manage its effects in microelectronic devices, especially newer devices that make use of 3D architectures.