Inhoudsopgave:
|
\u003ci\u003eAdvances in Imaging and Electron Physics, Volume 224\u003c/i\u003e highlights new advances in the field, with this new volume presenting interesting chapters on Measuring elastic deformation and orientation gradients by scanning electron microscopy - conventional, new and emerging methods, Development of an alternative global method with high angular resolution, Implementing the new global method, Numerical validation of the method and influence of optical distortions, and Applications of the method.\u003cul\u003e \u003cli\u003eProvides the authority and expertise of leading contributors from an international board of authors\u003c/li\u003e \u003cli\u003ePresents the latest release in the Advances in Imaging and Electron Physics series\u003c/li\u003e \u003cli\u003eUpdated release includes the latest information on Measuring elastic deformation and orientation gradients by scanning electron microscopy - conventional, new and emerging methods\u003c/li\u003e\u003c/ul\u003e |
nl
en