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Process and Pattern in Culture Essays in Honor of Julian H. Steward

Hoofdkenmerken

Auteur:	Chapman, John W.
Redactie:	Chapman, John W.
Titel:	Process and Pattern in Culture Essays in Honor of Julian H. Steward
Uitgever:	Taylor & Francis Inc
ISBN:	9780202361345
Land van oorsprong:	United States
Prijs:	€ 70.02
Verschijningsdatum:	15-12-2007
Bericht:	Langere levertijd (2-3 weken)

Inhoudelijke kenmerken

Categorie:

Social & cultural anthropology, ethnography

Technische kenmerken

Verschijningsvorm:	Paperback / softback
Paginas:	446
Hoogte mm.:	229
Breedte mm.:	152
Gewicht gr.:	589

Inhoud:

This festschrift commemorates Julian H. Steward. The essays were contributed by former students, colleagues, and other anthropologists whose research or thinking has been influenced by him. There was no preconceived attempt to give the volume any greater sense of unity or to impose upon the contributors any restrictions as to subject matter