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Hot Carrier Design Considerations for MOS Devices and Circuits

Hoofdkenmerken

Auteur:	Wang, Cheng
Redactie:	Wang, Cheng
Titel:	Hot Carrier Design Considerations for MOS Devices and Circuits
Uitgever:	Springer-Verlag New York Inc.
ISBN:	9781468485493
Editie:	Softcover reprint of the original 1st ed. 1992
Land van oorsprong:	United States
Prijs:	€ 122,45
Verschijningsdatum:	02-06-2012
Bericht:	Langere levertijd (2-3 weken)

Inhoudelijke kenmerken

Leesniveau:	Professional & Vocational
Categorie:	Interdisciplinary studies
Geillustreerd:	60 Illustrations, black and white; XVI, 334 p. 60 illus.

Technische kenmerken

Verschijningsvorm:	Paperback / softback
Paginas:	334
Hoogte mm.:	229
Breedte mm.:	152
Gewicht gr.:	521

Inhoud:

This book ad dresses these hot-carrier design issues for MOS devices and circuits, and is used primarily as a professional guide for process development engi neers, device engineers, and circuit designers who are interested in the latest developments in hot-carrier degradation modeling and hot-carrier reliability design techniques.